论文标题
拓扑超导体中的两电子光发射光谱
Two-electron photoemission spectroscopy in Topological Superconductors
论文作者
论文摘要
我们证明，以两个电子重合光谱（2 $ e $ -ARPES）实验测量的照片电子计数$ p^{（2）} $，为拓扑超导性的性质提供了前所未有的见解。特别是，我们表明$ p^{（2）} $的自旋依赖性允许一个人检测到即使没有相关的三胞胎超导顺序参数，也可以在拓扑超导体中诱导的超导旋转三个相关性。这种检测自旋三重相关性的能力使一个人可以区分两个最近提出的方案，用于FESE $ _ {0.45} $ te $ _ {0.55} $的拓扑超导性的显微镜起源。最后，我们表明$ p^{（2）} $具有可用于检测拓扑相变的特征强度最大值。
We demonstrate that the photo-electron counting rate, $P^{(2)}$, measured in two electron coincidence spectroscopy (2$e$-ARPES) experiments, provides unprecedented insight into the nature of topological superconductivity. In particular, we show that the spin dependence of $P^{(2)}$ allows one to detect superconducting spin-triplet correlations that are induced in a topological superconductor even in the absence of an associated triplet superconducting order parameter. This ability to detect spin-triplet correlations allows one to distinguish between two recently proposed scenarios for the microscopic origin of topological superconductivity in FeSe$_{0.45}$Te$_{0.55}$. Finally, we show that $P^{(2)}$ exhibits a characteristic intensity maximum that can be employed to detect topological phase transitions.
