论文标题
从单层4HE膜上吸附在石墨上的X射线衍射的模拟
Simulations of Surface X-ray Diffraction from a Monolayer 4He Film Adsorbed on Graphite
论文作者
论文摘要
我们从胶片上的单层胶片上胶片上的单层胶片胶片上的胶片胶片胶片进行了模拟，即具有原子分辨率的表面X射线衍射技术之一。我们的模拟表明，来自He单层的00升杆散射对来自石墨表面的范围大约L = 0.6-1.7且L = 2.2-3.5的石墨表面表现出显着的强度修饰。 He单层从石墨表面的高度在很大程度上影响CTR散射曲线，表明CTR散射具有足够的敏感性来确定HE层中各个相的表面结构。特别是，在不汇总固相中，我们的初步实验数据显示了当前仿真所期望的强度调制。
We carried out simulations of crystal truncation rod (CTR) scatterings, i.e., one of the surface X-ray diffraction techniques with atomic resolution, from a monolayer He film adsorbed on graphite. Our simulations reveal that the 00L rod scatterings from the He monolayer exhibit notable intensity modifications for those from a graphite surface in the ranges of approximately L = 0.6 - 1.7 and L = 2.2 - 3.5. The height of the He monolayer from the graphite surface largely affects the CTR scattering profiles, indicating that CTR scatterings have enough sensitivities to determine the surface structure of the various phases in the He layer. In particular, in the incommensurate solid phase, our preliminary experimental data show the intensity modulations that are expected from the present simulations.
