论文标题

识别MOSFET中的发散有效质量和$^3 $ HE系统

Identifying diverging-effective mass in MOSFET and $^3$He systems

论文作者

Kim, Hyun-Tak

论文摘要

诸如神经形态装置和量子的新兴设备可以使用莫特过渡现象,但尤其是,现象的不同机制仍然有待澄清。 The diverging-effective mass near Mott insulators was measured in strongly correlated Mott systems such as a fermion $^3$He and a Si metal-oxide-semiconductor-field-effect transistor, and is closely fitted by the effective mass obtained by the extension of the Brinkman-Rice(BR) picture, $ m^*/m = 1/[1-(u/u_c)^2] = 1/(1-κ^2_ {br}ρ^4)$当$κ^2_^2_ {br} {br} {\ lib} 1({\ neq} $ 1)乐队填充为$ρ$。它的识别是对Brinkman-Rice图片中恒定质量的渗透。评估了$κ__{br} {\ lot} 0.96 $。

Emerging devices such as a neuromorphic device and a qubit can use the Mott transition phenomenon, but in particular, the diverging mechanism of the phenomenon remains to be clarified. The diverging-effective mass near Mott insulators was measured in strongly correlated Mott systems such as a fermion $^3$He and a Si metal-oxide-semiconductor-field-effect transistor, and is closely fitted by the effective mass obtained by the extension of the Brinkman-Rice(BR) picture, $m^*/m=1/[1-(U/U_c)^2]=1/(1-κ^2_{BR}ρ^4)$ when $κ^2_{BR}{\approx}1({\neq}$1), where $0<U/U_c=κ_{BR}ρ^2<1$, correlation strength is $κ_{BR}$, band-filling is $ρ$. Its identification is a percolation of a constant mass in the Brinkman-Rice picture. Over $κ_{BR}{\approx}0.96$ is evaluated.

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