论文标题
石墨烯在硅混合场效应晶体管上
Graphene on Silicon Hybrid Field-Effect Transistors
论文作者
论文摘要
在过去的十年中,混合设备中石墨烯与硅在混合设备中的组合引起了广泛的关注。大多数此类设备都是针对光子学和射频应用提出的。在这项工作中,我们提出了一种独特的技术技术,即硅河畔石墨烯异质结构及其作为溶液门控晶体管的特性。塞利基河畔石墨烯场现场效应的晶体管(GOSFET)是为开发的,利用了排水源区域的各种构象和通道材料尺寸。制造的设备具有电特征,这些设备表现出具有特定于石墨烯和硅特征的杂种行为。尽管发现GOSFET的跨导率和载体的迁移率低于常规硅和石墨烯场现场效应晶体管(SIFETS和GFET),但证明混合通道内这两种材料在混合通道内的组合都对电荷载体的运输产生了独特的影响。专门开发了一种全面的基于物理的紧凑型建模,与实验数据表现出了极好的一致性。该模型被用来合理化观察到的杂种行为,因为在漂移扩散方法下的静电和载体传输的理论结果表明,石墨烯充当硅通道的屏蔽层,沿硅渠的屏蔽层,沿其沿硅的潜在分布,尤其是在亚阈值区域。与常规SIFET相比,由于该操作方案中不可忽略的扩散电流,这种石墨烯筛选效果与常规SIFET相比,在与常规SIFET相比时会严重影响设备子阈值的摆动。
The combination of graphene with silicon in hybrid devices has attracted attention extensively over the last decade. Most of such devices were proposed for photonics and radiofrequency applications. In this work, we present a unique technology of graphene-on-silicon heterostructures and their properties as solution-gated transistors. The graphene-on-Silicon field-effect transistors (GoSFETs) were fabricated exploiting various conformations of drain-source regions doping and channel material dimensions. The fabricated devices were electrically characterized demonstrating hybrid behavior with features specific to both graphene and silicon. Although GoSFET's transconductance and carrier's mobility were found to be lower than in conventional silicon and graphene field-effect transistors (SiFETs and GFETs), it was demonstrated that the combination of both materials within the hybrid channel contribute uniquely to the charge carrier transport. A comprehensive physics-based compact modeling was specifically developed, showing excellent agreement with the experimental data. The model is employed to rationalize the observed hybrid behavior as the theoretical results from the electrostatics and the carrier transport under a drift-diffusion approach show that graphene acts as a shield for the silicon channel, giving rise to a non-uniform potential distribution along it, especially at the subthreshold region. This graphene screening effect is shown to strongly affect the device subthreshold swing when compared against a conventional SiFET due to a non-negligible diffusion current in this operation regime.