论文标题

通过缝合的异地平面图像估算光场深度估计

Light Field Depth Estimation via Stitched Epipolar Plane Images

论文作者

Zhou, Ping, Shi, Langqing, Liu, Xiaoyang, Jin, Jing, Zhang, Yuting, Hou, Junhui

论文摘要

深度估计是光场处理中的一个基本问题。基于Epolar-Plane图像(EPI)方法经常会遇到挑战,例如由于离散误差和有限的角度分辨率而导致的斜率计算中的精度较低。此外,现有方法在大多数地区都表现良好,但很难在封闭的地区产生尖锐的边缘并解决无纹理区域的歧义。为了解决这些问题,我们提出了缝合 - EPI(SEPI)的概念,以增强斜率计算。 SEPI通过从不同EPIP的转移和串联线路来实现这一目标,这与相同的3D点相对应。此外,我们介绍了半Sepi算法,该算法仅集中在无封闭的线路部分以处理闭塞的地方。此外,我们提出了一种旨在改善无纹理区域深度估计的深度传播策略。该策略涉及通过从边缘向内部发展的,确定此类区域的深度,将准确区域优先于粗区域。通过广泛的实验评估和消融研究,我们验证了我们提出的方法的有效性。结果表明,与最先进的方法相比,其在所有区域之间生成更准确和稳健的深度图的能力。源代码将在https://github.com/pingzhou-lf/light-field-depth----------------------------------------------------

Depth estimation is a fundamental problem in light field processing. Epipolar-plane image (EPI)-based methods often encounter challenges such as low accuracy in slope computation due to discretization errors and limited angular resolution. Besides, existing methods perform well in most regions but struggle to produce sharp edges in occluded regions and resolve ambiguities in texture-less regions. To address these issues, we propose the concept of stitched-EPI (SEPI) to enhance slope computation. SEPI achieves this by shifting and concatenating lines from different EPIs that correspond to the same 3D point. Moreover, we introduce the half-SEPI algorithm, which focuses exclusively on the non-occluded portion of lines to handle occlusion. Additionally, we present a depth propagation strategy aimed at improving depth estimation in texture-less regions. This strategy involves determining the depth of such regions by progressing from the edges towards the interior, prioritizing accurate regions over coarse regions. Through extensive experimental evaluations and ablation studies, we validate the effectiveness of our proposed method. The results demonstrate its superior ability to generate more accurate and robust depth maps across all regions compared to state-of-the-art methods. The source code will be publicly available at https://github.com/PingZhou-LF/Light-Field-Depth-Estimation-Based-on-Stitched-EPIs.

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