论文标题

SIC中的无均匀拓宽的分区缺陷集合中电磁诱导的透明度

Electromagnetically induced transparency in inhomogeneously broadened divacancy defect ensembles in SiC

论文作者

Zwier, Olger V., Bosma, Tom, Gilardoni, Carmem M., Yang, Xu, Onur, Alexander R., Ohshima, Takeshi, Son, Nguyen T., van der Wal, Caspar H.

论文摘要

电磁诱导的透明度(EIT)是一种现象,可以在光学信号和电子自旋的量子相干性之间提供强大而强大的接口。它以原子介质探索的原型形式,使用了三级系统的(几乎)均匀的合奏,其中两个低能的自旋1/2级别耦合到常见的光学激发态。我们研究了用碳化硅中C轴脱水颜色中心的EIT实施。尽管该材料具有具有近IR光学量的量子设备技术的吸引人特性,但实施EIT是由于整个集合中的光学转变的不均匀扩展以及多个地基水平的存在而变得复杂。这些可能会导致谐振光激发后的合奏变暗。在这里,我们表明,在仔细设计测量几何形状时,在此材料平台上也可以在该材料平台中建立EIT。将我们的实验结果与基于Lindblad方程的模型进行比较表明,在这些系统中,我们可以在两个级别的不同两个级别之间创建连贯,对无RF量子量子传感应用具有潜在影响。我们的工作提供了对具有重要不均匀性的多级系统中EIT的理解,我们的考虑对于半导体中的各种缺陷有效。

Electromagnetically induced transparency (EIT) is a phenomenon that can provide strong and robust interfacing between optical signals and quantum coherence of electronic spins. In its archetypical form, mainly explored with atomic media, it uses a (near-)homogeneous ensemble of three-level systems, in which two low-energy spin-1/2 levels are coupled to a common optically excited state. We investigate the implementation of EIT with c-axis divacancy color centers in silicon carbide. While this material has attractive properties for quantum device technologies with near-IR optics, implementing EIT is complicated by the inhomogeneous broadening of the optical transitions throughout the ensemble and the presence of multiple ground-state levels. These may lead to darkening of the ensemble upon resonant optical excitation. Here, we show that EIT can be established with high visibility also in this material platform upon careful design of the measurement geometry. Comparison of our experimental results with a model based on the Lindblad equations indicates that we can create coherences between different sets of two levels all-optically in these systems, with potential impact for RF-free quantum sensing applications. Our work provides an understanding of EIT in multi-level systems with significant inhomogeneities, and our considerations are valid for a wide array of defects in semiconductors.

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