论文标题
在有时间相关的dephasing噪声的情况下，随机基准测试
Randomized benchmarking in the presence of time-correlated dephasing noise
论文作者
论文摘要
随机基准测试已成为一种流行且易于实现的实验技术，用于衡量量子计算设备中的门操作质量。典型的随机基准测试过程将忠诚度的指数衰减确定为大门的基准测定序列的长度增加，并且使用衰减速率来估计门的忠诚度。然而，忠诚度呈指数衰减，依赖于大门中与时间无关或静态噪声的假设，在栅极序列上没有相关性或噪声的显着漂移，这在许多情况下是一种非常满意的条件。然而，已经观察到与标准指数衰减的偏差，通常归因于噪声中的一定时间相关性，尽管偏离的确切机制尚未得到充分探索。在这项工作中，我们检查了这个问题的随机基准测试问题，以进行时间相关的噪声 - 特别是用于时间相关的倾向噪声，以实现精确的溶解度----阐明可以预期偏离指数衰减的情况。
Randomized benchmarking has emerged as a popular and easy-to-implement experimental technique for gauging the quality of gate operations in quantum computing devices. A typical randomized benchmarking procedure identifies the exponential decay in the fidelity as the benchmarking sequence of gates increases in length, and the decay rate is used to estimate the fidelity of the gate. That the fidelity decays exponentially, however, relies on the assumption of time-independent or static noise in the gates, with no correlations or significant drift in the noise over the gate sequence, a well-satisfied condition in many situations. Deviations from the standard exponential decay, however, have been observed, usually attributed to some amount of time correlations in the noise, though the precise mechanisms for deviation have yet to be fully explored. In this work, we examine this question of randomized benchmarking for time-correlated noise---specifically for time-correlated dephasing noise for exact solvability---and elucidate the circumstances in which a deviation from exponential decay can be expected.
