论文标题
$ j_ \ mathrm {eff}的精确控制
Precise control of $J_\mathrm{eff}=1/2$ magnetic properties in Sr$_2$IrO$_4$ epitaxial thin films by variation of strain and thin film thickness
论文作者
论文摘要
我们报告了对应变和膜厚度对原型$ j_ \ mathrm {eff} = 1/2 $复合SR $ _2 $ _2 $ iro $ _4 $ y MATHRM {eff}的结构和磁性影响的全面研究。我们发现SR $ _2 $ IRO $ _4 $薄膜可以完全紧张，厚度为108 nm。通过使用X射线谐振散射，我们表明面外磁相关长度很大程度上取决于薄膜的厚度，但与薄膜的应变状态无关。这可以用作精细调整的拨盘，以调整平面外磁相关长度，并通过增加膜厚度来从二维（2D）转变为三维（2D）到三维（3D）行为。这些结果为SR $ _2 $ IRO $ _4 $的外在薄膜的系统自由度的系统控制提供了更清晰的图片，并揭示了一个丰富的游乐场探索$ 5D $ TRANSITION金属化合物的物理学的潜力。
We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal $J_\mathrm{eff}=1/2$ compound Sr$_2$IrO$_4$ by advanced X-ray scattering. We find that the Sr$_2$IrO$_4$ thin films can be grown fully strained up to a thickness of 108 nm. By using X-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional (2D) to three-dimensional (3D) behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr$_2$IrO$_4$ and bring to light the potential for a rich playground to explore the physics of $5d$-transition metal compounds.
