论文标题
用自定义的斑点规避光学衍射极限
Circumventing the optical diffraction limit with customized speckles
论文作者
论文摘要
斑点模式已被广泛用于成像技术，例如幽灵成像，动态斑点照明显微镜，结构化照明显微镜和光声波动成像。控制Speckles统计属性的能力的最新进展已使Speckle模式用于特定成像应用程序。在这项工作中，我们设计并创建了特殊的斑点图案，用于基于荧光照片处理的并行非线性模式刷样显微镜。我们提出了原则证明的实验证明，在该证明中，我们获得的空间分辨率是我们设置中照明光学的衍射极限的三倍。此外，我们表明，量身定制的斑点大大胜过标准斑点。我们的工作确定了定制的斑点是平行化超分辨率显微镜的有效工具。
Speckle patterns have been widely used in imaging techniques such as ghost imaging, dynamic speckle illumination microscopy, structured illumination microscopy, and photoacoustic fluctuation imaging. Recent advances in the ability to control the statistical properties of speckles has enabled the customization of speckle patterns for specific imaging applications. In this work, we design and create special speckle patterns for parallelized nonlinear pattern-illumination microscopy based on fluorescence photoswitching. We present a proof-of-principle experimental demonstration where we obtain a spatial resolution three times higher than the diffraction limit of the illumination optics in our setup. Furthermore, we show that tailored speckles vastly outperform standard speckles. Our work establishes that customized speckles are a potent tool in parallelized super-resolution microscopy.
