论文标题
使用角度分辨光发射光谱法测定二维晶体之间的原子间耦合
Determination of interatomic coupling between two-dimensional crystals using angle-resolved photoemission spectroscopy
论文作者
论文摘要
缺乏在石墨烯或单层过渡金属二分法中的二维晶体之间缺乏定向键，为垂直范德华异质结构的组件选择提供了异常的自由。但是，即使对于相同的层，它们的堆叠，特别是它们的晶体学方向之间的相对角度也会修饰结构的特性。我们证明，可以根据三层结构的角度分辨光发射光谱来确定两个二维晶体之间的原子间耦合，该光谱光谱具有一个对齐和一个扭曲的界面。每个接口都提供互补信息，并共同实现对耦合的自洽确定。我们通过研究扭曲的三层石墨烯来参数化碳原子的原子间耦合，并表明结果可以应用于具有不同曲折和层数的结构。我们的方法演示了如何在二维晶体中提取有关层间耦合的基本信息，并可以应用于许多其他范德华接口。
Lack of directional bonding between two-dimensional crystals like graphene or monolayer transition metal dichalcogenides provides unusual freedom in selection of components for vertical van der Waals heterostructures. However, even for identical layers, their stacking, in particular the relative angle between their crystallographic directions, modifies properties of the structure. We demonstrate that the interatomic coupling between two two-dimensional crystals can be determined from angle-resolved photoemission spectra of a trilayer structure with one aligned and one twisted interface. Each of the interfaces provides complementary information and together they enable self-consistent determination of the coupling. We parametrize interatomic coupling for carbon atoms by studying twisted trilayer graphene and show that the result can be applied to structures with different twists and number of layers. Our approach demonstrates how to extract fundamental information about interlayer coupling in a stack of two-dimensional crystals and can be applied to many other van der Waals interfaces.
