论文标题
由于快速，重复的电压而导致的加速绝缘老化：审查确定挑战和未来的研究需求
Accelerated Insulation Aging Due to Fast, Repetitive Voltages: A Review Identifying Challenges and Future Research Needs
论文作者
论文摘要
尽管已经研究了对不同设备中使用的绝缘系统使用电力转换的不利影响，但它们仅限于降压率和重复率低。这些结果不能用于基于下一代宽带盖（WBG）的转换系统，该转换系统的目标是快速（最高100 kV/us），并以高达500 kHz的高切换频率运行。频率和振荡速率是电压脉冲的两个最重要因素，影响了暴露于此类电压脉冲的绝缘系统的降解水平。本文审查了有关从中提到的避免速率和开关频率值的基于WBG的转换系统的挑战，并确定了技术差距和未来的研究需求。该论文为在基于WBG的转换系统中的快速，重复的电压柱上的介电和电绝缘设计的未来研究提供了一个框架。
Although the adverse effects of using power electronic conversion on the insulation systems used in different apparatuses have been investigated, they are limited to low slew rates and repetitions. These results cannot be used for next-generation wide bandgap (WBG) based conversion systems targeted to be fast (with a slew rate up to 100 kV/us) and operate at a high switching frequency up to 500 kHz. Frequency and slew rate are two of the most important factors of a voltage pulse, influencing the level of degradation of the insulation systems that are exposed to such voltage pulses. The paper reviews challenges concerning insulation degradation when benefitting from WBG-based conversion systems with the mentioned slew rate and switching frequency values and identifies technical gaps and future research needs. The paper provides a framework for future research in dielectrics and electrical insulation design for systems under fast, repetitive voltage pluses originated by WBG-based conversion systems.
