论文标题
60μm螺距CDTE双面条带检测器的成像和光谱性能
Imaging and Spectral Performance of a 60 μm Pitch CdTe Double-Sided Strip Detector
论文作者
论文摘要
我们已经评估了精细的螺距CDTE双面条带检测器(CDTE-DSD)的性能,该探测器最初是为硬X射线望远镜的焦平面检测器开发的,以观察太阳。该检测器的厚度为750 UM,有128条带电极的厚度为60 UM的带子孔正交放置在检测器的两侧,并覆盖了一个能量范围4 KEV至80 KEV。对光子相互作用和电荷共享效应深度的研究对于提供良好的光谱和成像性能至关重要。我们研究了由电荷捕获引起的光谱中观察到的尾巴结构,并开发了一种基于阳极和阴极条的诱导电荷信息重建光谱的新方法。通过应用此方法,如果阳极和阴极之间的能量差在1 keV之内,则可以在14 keV和60 keV的光子能量下分别获得0.76 keV和1.0 keV的能量分辨率(FWHM)。此外,如果能量差大于1 keV,则减少了60 keV的尾部分量,并且60 keV峰的能量分辨率从2.4 keV提高到1.5 keV(FWHM)。为了研究成像性能,我们使用5毫米厚的钨板构建了一个简单的成像系统,该钨板的针孔直径为100 um。我们利用直径为1 mm的BA-133放射性同位素作为目标源,结合了由0.5 mm厚度钨制成的100 UM狭缝。我们使用30 keV峰在100 UM缝隙后面的BA-133源成像,并在源检测器距离的中心放置了100 um针孔。通过在条之间应用电荷共享校正,我们成功地获得了比60 UM的脱衣舞效率更好的位置分辨率。
We have evaluated the performance of a fine pitch CdTe Double-sided Strip Detector (CdTe-DSD), which was originally developed for the focal plane detector of a hard X-ray telescope to observe the Sun. The detector has a thickness of 750 um and has 128 strip electrodes with a 60 um strip pitch orthogonally placed on both sides of the detector and covers an energy range 4 keV to 80 keV. The study of the depth of photon interaction and charge sharing effects are of importance in order to provide good spectroscopic and imaging performance. We study the tail structure observed in the spectra caused by charge trapping and develop a new method to reconstruct the spectra based on induced charge information from both anode and cathode strips. By applying this method, energy resolutions (FWHM) of 0.76 keV and 1.0 keV can be obtained at photon energies of 14 keV and 60 keV, respectively, if the energy difference between the anode and cathode is within 1 keV. Furthermore, the tail component at 60 keV is reduced, and the energy resolution of the 60 keV peak is improved from 2.4 keV to 1.5 keV (FWHM) if the energy difference is greater than 1 keV. In order to study the imaging performance, we constructed a simple imaging system using a 5 mm thick tungsten plate that has a pinhole with a diameter of 100 um. We utilize a Ba-133 radioisotope of 1 mm in diameter as a target source in combination with a 100 um slit made from 0.5 mm thickness tungsten. We imaged the Ba-133 source behind the 100 um slit using a 30 keV peak, with a 100 um pinhole placed at the center of the source-detector distance. By applying a charge sharing correction between strips, we have succeeded in obtaining a position resolution better than the strip pitch of 60 um.