论文标题
旋转锁定测量中耦合Qubit-Defect系统的驱动状态放松
Driven-state relaxation of a coupled qubit-defect system in spin-locking measurements
论文作者
论文摘要
众所周知，自旋锁定噪声光谱是一种强大的技术，用于表征超导码头中低频噪声机理。在这里，我们表明，量子驱动的自旋锁定状态的松弛率可能会受到存在异恢复高频两级缺陷的显着影响。因此，在解释自旋锁定测量和其他类型的驱动状态噪声光谱镜检查中，应考虑低频和高频缺陷。
It is widely known that spin-locking noise-spectroscopy is a powerful technique for the characterization of low-frequency noise mechanisms in superconducting qubits. Here we show that the relaxation rate of the driven spin-locking state of a qubit can be significantly affected by the presence of an off-resonant high-frequency two-level-system defect. Thus, both low- and high-frequency defects should be taken into account in the interpretation of spin-locking measurements and other types of driven-state noise-spectroscopy.
