论文标题
近晶膜中缺陷的歼灭轨迹
Annihilation trajectory of defects in smectic-C films
论文作者
论文摘要
在2D液晶中，每个拓扑缺陷具有拓扑电荷和特征方向，因此可以被视为面向粒子。理论预测，歼灭缺陷的轨迹取决于它们的相对取向。最近，这些预测已在近晶膜的实验中进行了测试。这些实验发现弯曲的轨迹与预测相似，但是缺陷方向与远场导演之间的详细关系是不同的。为了理解这种差异，我们通过添加弹性各向异性的效果来扩展先前的理论，并发现它显着改变了弯曲的轨迹。
In a 2D liquid crystal, each topological defect has a topological charge and a characteristic orientation, and hence can be regarded as an oriented particle. Theories predict that the trajectories of annihilating defects depend on their relative orientation. Recently, these predictions have been tested in experiments on smectic-C films. Those experiments find curved trajectories that are similar to the predictions, but the detailed relationship between the defect orientations and the far-field director is different. To understand this difference, we extend the previous theories by adding the effects of elastic anisotropy, and find that it significantly changes the curved trajectories.
