论文标题
使用Cerenkov辐射测量厚样品中折射率的折射率
Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence
论文作者
论文摘要
阴极发光（CL）已演变为（扫描）透射电子显微镜中的标准分析技术。 CL利用由于电子梁和样品之间的相互作用而激发的光。在本研究中，我们专注于Cerenkov辐射。我们利用了电子透明标本充当相干发射辐射的Fabry-Pérot干涉仪的事实。从依赖厚度依赖性测量的波长依赖性干扰模式中，我们计算了研究材料的折射率。我们描述了这种方法的极限，并通过使用价电子损失光谱法（VEELS）将其与折射率的测定进行了比较。
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pérot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS)
